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 March 2001
(R)
AS7C513 AS7C3513
5V/3.3V 32Kx16 CMOS SRAM Features
* AS7C513 (5V version) * AS7C3513 (3.3V version) * Industrial and commercial temperature * Organization: 32,768 words x 16 bits * Center power and ground pins * High speed - 12/15/20 ns address access time - 6,7,8 ns output enable access time * Low power consumption: ACTIVE - 800 mW (AS7C513) / max @ 12 ns - 432 mW (AS7C3513) / max @ 12 ns * Low power consumption: STANDBY - 28 mW (AS7C513) / max CMOS - 18 mW (AS7C3513) / max CMOS * 2.0V data retention * Easy memory expansion with CE, OE inputs * TTL-compatible, three-state I/O * 44-pin JEDEC standard package - 400 mil SOJ - 400 mil TSOP II * ESD protection 2000 volts * Latch-up current 200 mA
Logic block diagram
A0 A2 A3 A4 A5 A6 A7 I/O0-I/O7 I/O8-I/O15
Pin arrangement
Row decoder
VCC
44-Pin SOJ, TSOP II (400 mil)
NC A3 A2 A1 A0 CE I/O0 I/O1 I/O2 I/O3 VCC GND I/O4 I/O5 I/O6 I/O7 WE A14 A13 A12 A11 NC 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23 A4 A5 A6 OE UB LB I/O15 I/O14 I/O13 I/O12 GND VCC I/O11 I/O10 I/O9 I/O8 NC A7 A8 A9 A10 NC
A1
32K x 16 Array
GND
Control circuit Column decoder
A8 A9 A10 A11 A12 A13 A14
WE
UB OE LB CE
Selection guide
AS7C513-12 AS7C3513-12 Maximum address access time Maximum output enable access time Maximum operating current Maximum CMOS standby current
Shaded areas indicate advance information.
AS7C513-15 AS7C3513-15 15 7 150 110 5 5
AS7C513 AS7C3513
I/O buffer
AS7C513-20 AS7C3513-20 20 9 140 100 5 5
Unit ns ns mA mA mA mA
12 5 AS7C513 AS7C3513 AS7C513 AS7C3513 160 120 5 5
3/23/01; v.1.0
Alliance Semiconductor
P. 1 of 10
Copyright (c) Alliance Semiconductor. All rights reserved.
AS7C513 AS7C3513
(R)
Functional description
The AS7C513 and the AS7C3513 are high performance CMOS 524,288-bit Static Random Access Memory (SRAM) devices organized as 32,768 words x 16 bits. They are designed for memory applications where fast data access, low power, and simple interfacing are desired. Equal address access and cycle times (tAA, tRC, tWC) of 12/15/20 ns with output enable access times (tOE) of 6,7,8 ns are ideal for high performance applications. The chip enable input CE permits easy memory expansion with multiple-bank memory systems. When CE is high, the devices enter standby mode. The AS7C513 and AS7C3513 are guaranteed not to exceed 28/18 mW power consumption in CMOS standby mode. The devices also offer 2.0V data retention. A write cycle is accomplished by asserting write enable (WE), (UB) and/or (LB), and chip enable (CE). Data on the input pins I/O0-I/O7, and/or I/O8-I/O15, is written on the rising edge of WE (write cycle 1) or CE (write cycle 2). To avoid bus contention, external devices should drive I/O pins only after outputs have been disabled with output enable (OE) or write enable (WE). A read cycle is accomplished by asserting output enable (OE), (UB) and (LB), and chip enable (CE), with write enable (WE) high. The chips drive I/O pins with the data word referenced by the input address. When either chip enable or output enable is inactive, or write enable is active, or (UB) and (LB), output drivers stay in high-impedance mode. The devices provide multiple center power and ground pins, and separate byte enable controls, allowing individual bytes to be written and read. LB controls the lower bits, I/O0-I/O7, and UB controls the higher bits, I/O8-I/O15. All chip inputs and outputs are TTL-compatible. The AS7C513 and AS7C3513 are packaged in common industry standard packages.
Absolute maximum ratings
Parameter Voltage on VCC relative to GND Voltage on any pin relative to GND Power dissipation Storage temperature (plastic) Ambient temperature with VCC applied DC current into outputs (low) Device AS7C513 AS7C3513 Symbol Vt1 Vt1 Vt2 PD Tstg Tbias IOUT Min -0.50 -0.50 -0.50 - -65 -55 - Max +7.0 +5.0 VCC +0.50 1.0 +150 +125 50 Unit V V V W
o o
C C
mA
NOTE: Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
Truth table
CE H L L L L L L L L WE X H H H L L L H X OE X L L L X X X H X LB X L H L L L H X H UB X H L L L H L X H I/O0-I/O7 High Z DOUT High Z DOUT DIN DIN High Z High Z I/O8-I/O15 High Z High Z DOUT DOUT DIN High Z DIN High Z Mode Standby (ISB, ISBI) Read I/O0-I/O7 (ICC) Read I/O8-I/O15 (ICC) Read I/O0-I/O15 (ICC) Write I/O0-I/O15 (ICC) Write I/O0-I/O7 (ICC) Write I/O8-I/O15 (ICC) Output disable (ICC)
Key: X = Don't care; L = Low; H = High
3/23/01; v.1.0
Alliance Semiconductor
P. 2 of 10
AS7C513 AS7C3513
(R)
Recommended operating conditions
Parameter Supply voltage Device AS7C513 AS7C3513 AS7C513 Input voltage commercial industrial AS7C3513 Symbol VCC VCC VIH VIH VIL Ambient operating temperature
Min 4.5 3.0 2.2 2.0 -0.5 0 -40
Typical 5.0 3.3 - - - - -
Max 5.5 3.6 VCC + 0.5 VCC + 0.5 0.8 70 05
Unit V V V V C C
TA TA
VIL min = -3.0V for pulse width less than tRC/2.
DC operating characteristics (over the operating range)1
-12 Parameter Input leakage current Output leakage current Symbol | ILI | | ILO | Test conditions VCC = Max VIN = GND to VCC VCC = Max VOUT = GND to VCC VCC = Max, CE VIL f = fMax , IOUT = 0mA VCC = Max, CE VIL f = fMax , IOUT = 0mA VCC = Max, CE VCC-0.2V VIN GND + 0.2V or VIN VCC -0.2V, f = 0 IOL = 8 mA, VCC = Min IOH = -4 mA, VCC = Min AS7C513 AS7C3513 AS7C513 AS7C3513 AS7C513 AS7C3513 Device -15 -20 Min Max Min Max Min Max Unit - - - - - - - - - 2.4 1 1 160 120 40 40 3 3 0.4 - - - - - - - - - - 2.4 1 1 150 110 40 40 3 3 0.4 - - - - - - - - - - 2.4 1 1 140 100 40 40 3 3 0.4 - mA V V A A mA mA
Operating power supply ICC current ISB Standby power supply current ISB1 VOL
VOH Shaded areas indicate advance information.
Output voltage
Capacitance (f = 1MHz, Ta = 25o C, VCC = NOMINAL)2
Parameter Input capacitance I/O capacitance Symbol CIN CI/O Signals A, CE, WE, OE, LB, UB I/O Test conditions Vin = 0V Vin = Vout = 0V Max Unit 5 7 pF pF
3/23/01; v.1.0
Alliance Semiconductor
P. 3 of 10
AS7C513 AS7C3513
(R)
Read cycle (over the operating range) 3,9
-12 Parameter Read cycle time Address access time Chip enable (CE) access time Output enable (OE) access time Output hold from address change CE Low to output in low Z CE High to output in high Z OE Low to output in low Z Byte select access time Byte select Low to low Z Byte select High to high Z OE High to output in high Z Power up time Power down time
Shaded areas indicate advance information.
-15 Max - 12 12 6 - - 6 - 6 - 6 6 - 12 Min 15 - - - 4 0 - 0 - 0 - - 0 - Max - 15 15 7 - - 7 - 7 - 7 7 - 15 Min 20 - - - 4 0 - 0 - 0 - - 0 -
-20 Max - 20 20 8 - - 8 - 8 - 9 9 - 20 Unit ns ns ns ns ns ns ns ns ns ns ns ns ns ns 4,5 4,5 4, 5 4, 5 4, 5 5 4, 5 4, 5 4, 5 3 3 Notes
Symbol tRC tAA tACE tOE tOH tCLZ tCHZ tOLZ tBA tBLZ tBHZ tOHZ tPU tPD
Min 12 - - - 3 0 - 0 - 0 - - 0 -
Key to switching waveforms
Rising input Falling input
tRC Address tOH Data OUT Previous data valid tAA Data valid tOH
Undefined output/don't care
Read waveform 1 (address controlled)3,6,7,9
Read waveform 2 (CE, OE, UB, LB controlled)3,6,8,9
tRC Address tAA OE tOE tOLZ CE tACE tLZ LB, UB tBA tBLZ Data OUT 3/23/01; v.1.0 Data valid tBHZ tOHZ tHZ tOH
Alliance Semiconductor
P. 4 of 10
AS7C513 AS7C3513
(R)
Write cycle (over the operating range)11
-12 Parameter Write cycle time Chip enable (CE) to write end Address setup to write end Address setup time Write pulse width Address hold from end of write Data valid to write end Data hold time Write enable to output in high Z Output active from write end Byte select Low to end of write
Shaded areas indicate advance information.
-15 Min 15 10 10 0 10 0 8 0 - 3 9 Max - - - - - - - - 7 - - - - - - - - - - 6 - - 20 12 12 0 12 0 10 0 - 3 12
-20 Min Max - - - - - - - - 9 - - Unit ns ns ns ns ns ns ns ns ns ns ns 5 4, 5 4, 5 Notes
Symbol tWC tCW tAW tAS tWP tAH tDW tDH tWZ tOW tBW
Min 12 9 8 0 8 0 6 0 - 3 8
Max
Write waveform 1(WE controlled)10,11
tWC Address tBW LB, UB tAS WE tDW Data IN tWZ Data OUT Data undefined Data valid tOW High-Z tDH tAW tWP
Write waveform 2 (CE controlled)10,11
tWC Address tAS CE tCW tAW tBW LB, UB tWP WE tDW Data IN tCLZ Data OUT High-Z tWZ Data undefined High-Z Data valid tOW tDH tAH
3/23/01; v.1.0
Alliance Semiconductor
P. 5 of 10
AS7C513 AS7C3513
(R)
Data retention characteristics (over the operating range)13
Parameter VCC for data retention Data retention current Chip deselect to data retention time Operation recovery time Input leakage current Symbol VDR ICCDR tCDR tR | ILI | Test conditions VCC = 2.0V CE VCC-0.2V VIN VCC-0.2V or VIN 0.2V Min 2.0 - 0 tRC - Max - 500 - - 1 Unit V A ns ns A
Data retention waveform
Data retention mode VCC VCC tCDR CE VIH VDR VIH VDR 2.0V VCC tR
AC test conditions
Output load: see Figure B or Figure C. Input pulse level: GND to 3.0V. See Figure A. Input rise and fall times: 2 ns. See Figure A. Input and output timing reference levels: 1.5V.
Dout 255 Thevenin equivalent: 168 Dout +1.728V (5V and 3.3V) +5V 480 +3.0V GND 90% 10% 2 ns 90% 10% C(14) Dout 350 +3.3V 320 C(14)
Figure A: Input pulse
GND Figure B: 5V Output load
GND Figure C: 3.3V Output load
Notes
1 2 3 4 5 6 7 8 9 10 11 12 13 14 During VCC power-up, a pull-up resistor to VCC on CE is required to meet ISB specification. This parameter is sampled, but not 100% tested. For test conditions, see AC Test Conditions, Figures A, B, and C. These parameters are specified with CL = 5pF, as in Figures B or C. Transition is measured 500mV from steady-state voltage. This parameter is guaranteed, but not 100% tested. WE is High for read cycle. CE and OE are Low for read cycle. Address valid prior to or coincident with CE transition Low. All read cycle timings are referenced from the last valid address to the first transitioning address. CE or WE must be High during address transitions. Either CE or WE asserting high terminates a write cycle. All write cycle timings are referenced from the last valid address to the first transitioning address. Not applicable. 2V data retention applies to the commercial operating range only. C=30pF, except on High Z and Low Z parameters, where C=5pF.
3/23/01; v.1.0
Alliance Semiconductor
P. 6 of 10
AS7C513 AS7C3513
(R)
Typical DC and AC characteristics
1.4 1.2 Normalized ICC, ISB 1.0 0.8 0.6 0.4 0.2 0.0 MIN NOMINAL Supply voltage (V) Normalized access time tAA vs. supply voltage VCC MAX ISB Normalized ICC, ISB ICC Normalized supply current ICC, ISB vs. supply voltage VCC 1.4 1.2 1.0 0.8 0.6 0.4 0.2 0.0 -55 -10 35 80 125 Ambient temperature (C) Normalized access time tAA vs. ambient temperature Ta ISB ICC Normalized supply current ICC, ISB vs. ambient temperature Ta Normalized ISB1 (log scale) 625 25 5 1 0.2 Normalized supply current ISB1 vs. ambient temperature Ta
VCC = VCC(NOMINAL)
0.04 -55 -10 35 80 125 Ambient temperature (C)
1.5 Normalized access time 1.4 1.3 1.2 1.1 1.0 0.9 0.8 MIN
1.5 Normalized access time 1.4
1.4 1.2
Normalized supply current ICC vs. cycle frequency 1/tRC, 1/tWC
Ta = 25C
1.2 1.1 1.0 0.9 0.8 -55 -10 35 80 125 Ambient temperature (C) Output sink current IOL vs. output voltage VOL
Normalized ICC
1.3
VCC = VCC(NOMINAL)
1.0 0.8 0.6 0.4 0.2 0.0 0
VCC = VCC(NOMINAL) Ta = 25C
NOMINAL Supply voltage (V) Output source current IOH vs. output voltage VOH
MAX
25 50 75 Cycle frequency (MHz)
100
Typical access time change tAA vs. output capacitive loading 35 30 Change in tAA (ns) VCC = VCC(NOMINAL)
140 Output source current (mA) 120 100 80 60 40 20 0 0
140 Output sink current (mA) 120 100 80 60 40 20 0 VCC 0
VCC = VCC(NOMINAL)PL Ta = 25C
VCC = VCC(NOMINAL) Ta = 25C
25 20 15 10 5 0
VCC Output voltage (V)
0
Output voltage (V)
250 500 750 Capacitance (pF)
1000
3/23/01; v.1.0
Alliance Semiconductor
P. 7 of 10
AS7C513 AS7C3513
(R)
Package dimensions
44-pin TSOP II
44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23
c
A A1
Min (mm)
Max (mm) 1.2
0.05 0.95 0.25 1.05 0.45
44-pin TSOP II
e He
A2 b c
0.15 (typical) 18.28 10.06 11.56 18.54 10.26 11.96
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22
d e He
d l 0-5 A1 b E D
A
A2
E l
0.80 (typical) 0.40 0.60
e 44-pin SOJ
E1 E2
Pin 1
B A b Seating Plane A2 E2
c
A1
A A1 A2 B b c D E E1 E2 e
44-pin SOJ 400 mil Min Max 0.128 0.148 0.025 1.105 1.115 0.026 0.032 0.015 0.020 0.007 0.013 1.120 1.130 0.370 NOM 0.395 0.405 0.435 0.445 0.050 NOM
Ordering codes
Package\Access time Plastic SOJ, 400 mil Volt/Temp 5V commercial 3.3V commercial 5V commercial 3.3V commercial 12 ns AS7C513-12JC AS7C3513-12JC AS7C513-12TC AS7C3513-12TC 15 ns AS7C513-15JC AS7C3513-15JC AS7C513-15TC AS7C3513-15TC 20 ns AS7C513-20JC AS7C3513-20JC AS7C513-20TC AS7C3513-20TC
TSOP II, 18.4x10.2 mm
NA: not available.
Part numbering system
AS7C X 513 -XX X Package: J = SOJ 400 mil T = TSOP II, 18.4x10.2 mm C Commercial temperature range: 0 oC to 70 0C Industrial temperature range: -40C to 85C
Voltage:Blank = 5V CMOS SRAM prefix 3 = 3.3V CMOS
Device number Access time
3/23/01; v.1.0
Alliance Semiconductor
P. 8 of 10
AS7C513 AS7C3513
(R)
3/23/01; v.1.0
Alliance Semiconductor
P. 9 of 10
(c) Copyright Alliance Semiconductor Corporation. All rights reserved. Our three-point logo, our name and Intelliwatt are trademarks or registered trademarks of Alliance. All other brand and product names may be the trademarks of their respective companies. Alliance reserves the right to make changes to this document and its products at any time without notice. Alliance assumes no responsibility for any errors that may appear in this document. The data contained herein represents Alliance's best data and/or estimates at the time of issuance. Alliance reserves the right to change or correct this data at any time, without notice. If the product described herein is under development, significant changes to these specifications are possible. The information in this product data sheet is intended to be general descriptive information for potential customers and users, and is not intended to operate as, or provide, any guarantee or warrantee to any user or customer. Alliance does not assume any responsibility or liability arising out of the application or use of any product described herein, and disclaims any express or implied warranties related to the sale and/or use of Alliance products including liability or warranties related to fitness for a particular purpose, merchantability, or infringement of any intellectual property rights, except as express agreed to in Alliance's Terms and Conditions of Sale (which are available from Alliance). All sales of Alliance products are made exclusively according to Alliance's Terms and Conditions of Sale. The purchase of products from Alliance does not convey a license under any patent rights, copyrights, mask works rights, trademarks, or any other intellectual property rights of Alliance or third parties. Alliance does not authorize its products for use as critical components in life-supporting systems where a malfunction or failure may reasonably be expected to result in significant injury to the user, and the inclusion of Alliance products in such life-supporting systems implies that the manufacturer assumes all risk of such use and agrees to indemnify Alliance against all claims arising from such use
AS7C513 AS7C3513
(R)
3/23/01; v.1.0
Alliance Semiconductor
P. 10 of 10


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